CAMECA SX100 #750

CAMECA SX100 Electron Probe Microanalyzer

Location: 2005B North University Building
Contact: Owen Neill

  • CAMECA SX100 #750, Installed 2002
    • Partial funding from the National Science Foundation, Award #EAR9911352.
    • Additional funding from EMAL, the Department of Geological Sciences, the College of Literature, Science and the Arts, and the Office of the Vice President for Research.
  • Electron Optics and Imaging
    • Self-biasing LaB6 cathode.
    • Two-stage electromagnetic condenser lenses.
    • Beam regulation from 1-300nA.
    • Secondary and backscatter electron detectors for electron imaging.
    • CAMECA panchromatic cathodoluminescence detector for CL imaging.
  • Energy-Dispersive X-ray Spectrometry
    • Bruker XFlash 2000 silicon-drift energy-dispersive X-ray spectrometer.
  • Wavelength-Dispersive X-ray Spectrometry
    • Five wavelength-dispersive X-ray spectrometers with 160mm Rowland circles.
    • Diffracting crystals capable of analyzing B-U.
      • Spectrometer 1: LTAP, LPC0
      • Spectrometer 2: PET, TAP, PC1, PC2.5
      • Spectrometer 3: LLiF, LPET
      • Spectrometer 4: LLiF, LPET
      • Spectrometer 5: LiF, PET, TAP, PC2
    • Large-area diffracting crystals (spectrometers 1, 3 and 4) for increased sensitivity.
  • Software and Data Processing
    • ProbeForEPMA, ProbeImage, and CAMECA PeakSight software for automated data acquistion and processing.
    • PictureSnappApp software for sample navigation.
    • Bruker Esprit v1.8 EDS acquisition software.
    • Separate PC for offline data reduction.