Main Capabilities of Rigaku Ultima IV Diffractometer
- Power diffraction methods:
- Search /Match, structure determination
- Quantitative analysis (including Reference Intensity Ratio method (RIR)), whole pattern fitting (Rietveld Refinement)
- Size/Strain analysis
- Temperature dependent XRD (rm ~ 1500 C)
- Humidity dependent XRD measurement
- X-ray parallel beam methods
- Thin film crystallography
- Single crystal orientation determination
- Glancing /Grazing angle XRD method
- Texture – preferred orientation methods / pole figures
- Rocking curve analysis
- Reciprocal lattice/space mapping
- X-ray reflectivity methods
- Small angle X-ray scattering (SAXS)
- Residual Stress measurement for film and bulk specimens
Further Information